UL 61215-1-3 TERRESTRIAL PHOToVOLTAIC (PV) MODULES- DESIGNQUALIFICATION AND TYPE APPROVAL-Part 1-3: Specialrequirements for testing of thin-film amorphous silicon basedphotovoltaic (PV) modules
Scope
This document lays down requirements for the design qualification of terrestrial photovoltaic modulessuitable for long-term operation in open-air climates. The useful service life of modules so qualified willdepend on their design, their environment and the conditions under which they are operated. Test resultsare not construed as a quantitative prediction of module lifetime.
ln climates where 9"h percentile operating temperatures exceed 70 °C, users are recommended toconsider testing to higher temperature test conditions as described in lEC TS 63126.Users desiringqualification of PV products with lesser lifetime expectations are recommended to consider testingdesigned for PV in consumer electronics, as described in lEC 63163(under development). Users wishingto gain confidence that the characteristics tested in lEC 61215 appear consistently in a manufacturedproduct may wish to utilize lEC 62941 regarding quality systems in PV manufacturing.
This document is intended to apply to all thin-film amorphous silicon (a-Si; a-Siluc-Si) based terrestrial flatplate modules. As such, it addresses special requirements for testing of this technology supplementingIEC 61215-1:2021 and lEC 61215-2:2021 requirements for testing.
This document does not apply to modules used with concentrated sunlight although it may be utlized forlow concentrator modules (1 to 3 suns).For low concentration modules, all tests are performed using theirradiance, current, voltage and power levels expected at the design concentration.
The object of this test sequence is to determine the electrical characteristics of the module and to show, asfar as possible within reasonable constraints of cost and time, that the module is capable of withstandingprolonged exposure outdoors.Accelerated test conditions are empirically based on those necessary toreproduce selected observed field failures and are applied equally across module types.Accelerationfactors may vary with product design and thus not all degradation mechanisms may manifest.Further

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