IEC 61000-4-29:2000 ELECTROMAGNETIC COMPATIBILITY (EMC)-Part 4-29:Testing and measurement techniques-Voltage dips, short interruptions and voltage variations on d.c.input power port immunity tests

IEC 61000-4-29:2000 ELECTROMAGNETIC COMPATIBILITY (EMC)-Part 4-29: Testing and measurement techniques -Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
1 Scope and object
This part of lEC 61000 defines test methods for immunity to voltage dips, short interruptionsand voltage variations at the d.c. input power port of electrical or electronic equipment.
This standard is applicable to low voltage d.c. power ports of equipment supplied by externald.c. networks.
The object of this standard is to establish a common and reproducible basis for testingelectrical and electronic equipment when subjected to voltage dips，short interruptions orvoltage variations on d.c. input power ports.
This standard defines:

• the range of test levels;- the test generator;
• the test set-up;
  -the test procedure.
  The test described hereinafter applies to electrical and electronic equipment and systems. ltalso applies to modules or subsystems whenever the EUT (equipment under test) rated poweris greater than the test generator capacity specified in clause 6.
  The ripple at the d.c. input power port is not included in the scope of this part of lEC 61000. Itis covered by lEC 61000-4-171)

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